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Scanning electron microscope
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81	Surface Topography Considerations of Patterned Sapphire Substrates for Blue/Green light Emitting Diode General Considerations Nitride-based semiconductor materials (i.e., GaN, InGaN, AlN) have attracted considerable atte Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Intermolecular forces Chemistry Atomic force microscopy Image scanner Park Systems Piezoelectricity X-ray computed tomography Scanning electron microscope Scientific method Science Scanning probe microscopy
82	Conference Review: 11th Confocal Raman Imaging Symposium Many international researchers joined the 11th Confocal Raman Imaging Symposium from September 29th to October 01st 2014 in Ulm, Germany. The well-esta Add to Reading List Source URL: www.witec.de Language: English - Date: 2014-11-10 18:56:24 Microscopy Raman spectroscopy Electron microscopy Raman scattering Graphene Microscope Raman microscope Confocal microscopy Near-field scanning optical microscope Chemistry Physics Science
83	Raman Imaging and Scanning Electron Microscopy RISE Microscopy Correlative microscopy on a new level – Complementing ultra-structural SEM with Add to Reading List Source URL: www.witec.de Language: English - Date: 2014-08-08 08:32:57 Microscopy Spectroscopy Microscopes Raman spectroscopy Scanning electron microscope Electron microscope Optical microscope Raman microscope Near-field scanning optical microscope Scientific method Science Electron microscopy
84	Deep Sea Drilling Project Initial Reports Supplement to Volumes 38, 39, 40, and 41 Add to Reading List Source URL: www.deepseadrilling.org Language: English - Date: 2007-05-11 11:28:13 Manufacturing 100 micrometres 10 micrometres Silicon carbide Environmental scanning electron microscope Scanning electron microscope 1 micrometre Chemistry Electron microscopy Science
85	Final report_Final print version Add to Reading List Source URL: www.pctech.ise.polyu.edu.hk Language: English - Date: 2011-03-01 01:40:00 Semiconductor device fabrication Atomic force microscopy Scanning probe microscopy Electron microscope Reliability Plasma Microscopy Scientific method Science Chemistry
86	Original Work The Extracellular Matrix Produced from Alternaria alternata Japanese Pear Pathotype Plays a Possible Role of Adhesion on the Surfaces of Host Leaves during Plant Infection Add to Reading List Source URL: emtech.jp Language: English - Date: 2011-03-08 02:46:58 Science Electron microscope Staining Microscopy Scanning electron microscope Microscope Negative stain Histology Scientific method Electron microscopy Microbiology
87	Debsources Live and Historical Views on Macro-Level Software Evolution Matthieu Caneill Stefano Zacchiroli Add to Reading List Source URL: upsilon.cc Language: English - Date: 2014-09-18 05:03:49 Debian Free and open source software Denis Diderot Stefano Zacchiroli Deb Esem Environmental scanning electron microscope Open-source software Evolution Software Software licenses Cross-platform software
88	Nanotechnology Solutions Partner Park Systems Singapore. 33, Ubi Avenue 3, #07-47 Vertex Tower A SingaporeTel: +Mobile: +www.parkAFM.com © 2011 Park Systems Corp. All rights reserved. Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Intermolecular forces Chemistry Atomic force microscopy Park Systems Nanotechnology Nanometrology Image scanner Scanning electron microscope Vibrational analysis with scanning probe microscopy Scientific method Science Scanning probe microscopy
89	Nanotechnology Solutions Partner Park Systems Singapore. 33, Ubi Avenue 3, #07-47 Vertex Tower A SingaporeTel: +Mobile: +www.parkAFM.com © 2011 Park Systems Corp. All rights reserved. Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Chemistry Nanotechnology Park Systems Intermolecular forces Nanometrology Scanning electron microscope Spectroscopy Atomic force microscopy Vibrational analysis with scanning probe microscopy Scientific method Science Scanning probe microscopy
90	Goldschmidt 2000 September 3rd–8th, 2000 Oxford, UK. Journal of Conference Abstracts Volume 5(2), 636 Add to Reading List Source URL: www.the-conference.com Language: English - Date: 2009-11-05 06:54:13 Electron microscope Scanning electron microscope Transmission electron microscopy Microscopy Bacteria Mica Mineral Hard rime Scientific method Electron microscopy Science

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